The electric field of a charged particle beam bunch can affect the transmission of polarized light in electro-optical materials thereby providing a non-destructive method of determining the time structure of the bunch with a resolution of tens of femtoseconds. This technology has important diagnostic potential for current projects aimed at construction of linear electron colliders and free electron lasers operating in the far ultraviolet and x-ray region where extremely short electron bunch lengths are required. A novel application of this technology, in which the longitudinal electron bunch distribution is mapped to a spatial distribution on a CCD array, has the potential to readily yield sub-picosecond measurements with femptosecond resolution.
Some references with our work:
Y.K. Semertzidis {\em et al.,}Proceedings of the 1999 Particle Accelerator Conference, 490 (1999).
D.M. Lazarus {\em et al.,} Proceedings of the International Europhysics Conference on High Energy Physic, 993 (1999).
Y.K. Semertzidis {\em et al}., Nucl. Inst. Meth. {\bf A452}, 396 (2000).
T. Tsang {\em et al}., J. Appl. Phys., {\bf 89}, 4921 (2001).
T. Srinivasan-Rao {\em et al.,} 21st ICFA Beam Dynamics Workshop on Laser-Beam Interactions (2001). Proceedings to be published in the Physical Review Special Topics.
A SINGLE SHOT, SUBPICOSECOND BEAM BUNCH CHARACTERIZATION WITH ELECTROOPTIC TECHNIQUES. By Y.K. Semertzidis, R. Burns, V. Castillo, R. Larsen, D.M. Lazarus, D. Nikas, C. Ozben, T. Srinivasan-Rao, A. Stillman, T. Tsang (Brookhaven), L. Kowalski (Montclair State U.). Oct 2001. 3pp. Contributed to APS / DPF / DPB Summer Study on the Future of Particle Physics (Snowmass 2001), Snowmass, Colorado, 30 Jun - 21 Jul 2001. e-Print Archive: physics/0110052
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